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Nuclear Instruments and Methods in Physics Research. Section B-Beam Interactions with Materials and Atoms

Resumen/Descripción – provisto por la editorial en inglés
Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.
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Institución detectada Período Navegá Descargá Solicitá
No detectada desde ene. 1984 / hasta dic. 2023 ScienceDirect

Información

Tipo de recurso:

revistas

ISSN impreso

0168-583X

ISSN electrónico

1872-9584

País de edición

Países Bajos

Fecha de publicación

Cobertura temática

fisica

Ciencias físicas

Tabla de contenidos

doi: 10.1016/s0168-583x(01)00711-x

Electronic dosimeters based on solid state detectors

Jean Barthe

Pp. 158-189

doi: 10.1016/j.nimb.2004.03.017

High energy ion channeling

C. Cohen; D. Dauvergne

Palabras clave: Nuclear and High Energy Physics; Instrumentation.

Pp. 40-71

doi: 10.1016/j.nimb.2013.05.008

On the use of SRIM for computing radiation damage exposure

R.E. Stoller; M.B. Toloczko; G.S. Was; A.G. Certain; S. Dwaraknath; F.A. Garner

Palabras clave: Nuclear and High Energy Physics; Instrumentation.

Pp. 75-80

doi: 10.1016/j.nimb.2016.01.012

The first four years of the AMS-facility DREAMS: Status and developments for more accurate radionuclide data

Georg Rugel; Stefan Pavetich; Shavkat Akhmadaliev; Santiago Miguel Enamorado Baez; Andreas Scharf; René Ziegenrücker; Silke Merchel

Palabras clave: Instrumentation; Nuclear and High Energy Physics.

Pp. 94-100

doi: 10.1016/j.nimb.2016.12.004

Six decades of atomic collisions in solids

Peter Sigmund

Pp. 391-412

doi: 10.1016/j.nimb.2018.02.005

A note on extracting electronic stopping from energy spectra of backscattered slow ions applying Bragg’s rule

B. Bruckner; D. Roth; D. Goebl; P. Bauer; D. Primetzhofer

Palabras clave: Nuclear and High Energy Physics; Instrumentation.

Pp. 82-86

doi: 10.1016/j.nimb.2018.12.004

Non Rutherford elastic scattering to measure energy loss of H2 ions in aluminium

Brahim Touchrift; Houria Salah; Nadjia Benouali; Abdehamid Ziane

Pp. 175-179

doi: 10.1016/j.nimb.2020.05.023

A multipurpose set-up using keV ions for nuclear reaction analysis, high-resolution backscattering spectrometry, low-energy PIXE and in-situ irradiation experiments

S.A. Corrêa; E. PitthanORCID; M.V. MoroORCID; D. Primetzhofer

Palabras clave: Instrumentation; Nuclear and High Energy Physics.

Pp. 104-110

doi: 10.1016/j.nimb.2020.06.031

Electron-loss and destruction processes in collision of MeV/atom carbon cluster ions with rare gases

T. Kaneko; R. Usami; H. Morioka; Y. Saitoh; A. Chiba; K. Narumi

Palabras clave: Instrumentation; Nuclear and High Energy Physics.

Pp. 218-223

doi: 10.1016/j.nimb.2020.11.016

Geant4 physics processes for microdosimetry and secondary electron emission simulation: Extension of MicroElec to very low energies and 11 materials (C, Al, Si, Ti, Ni, Cu, Ge, Ag, W, Kapton and SiO2)

Q. Gibaru; C. Inguimbert; P. Caron; M. Raine; D. Lambert; J. Puech

Palabras clave: Nuclear and High Energy Physics; Instrumentation.

Pp. 66-77