Catálogo de publicaciones - libros
Título de Acceso Abierto
Challenges and New Trends in Power Electronic Devices Reliability
Resumen/Descripción – provisto por la editorial
No disponible.
Palabras clave – provistas por la editorial
photovoltaic system; battery; DC-coupled configuration; AC-coupled configuration; mission profile; reliability; LED; thermal cycling test; accelerated test; solder joint; cracks; current harmonics; voltage harmonics; power electronic converters; cables; capacitors; PPS; high-power thyristors; reverse recovery currents; electromagnetic launching field; segmented LSTM; microgrid inverter; IGBT reliability; online evaluation; fusion algorithm; multi-chip IGBT module; bond wire; module transconductance; temperature calibration; failure monitoring; sensor lamp; low-light mode; high-light mode; AC motor drive; junction temperature; lifetime prediction; power MOSFET; loss modeling; SiC MOSFET; AlGaN/GaN HEMT; cascode structure; single event effects; technology computer-aided design simulation; heavy-ion irradiation experiment; photovoltaic systems; DC/AC converter; maintenance; power system faults; availability; condition monitoring; power device; power electronics; n/a
Disponibilidad
Institución detectada | Año de publicación | Navegá | Descargá | Solicitá |
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No requiere | Directory of Open access Books |
Información
Tipo de recurso:
libros
ISBN electrónico
978-3-0365-1176-4
País de edición
Suiza