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Microelectronics Reliability

Resumen/Descripción – provisto por la editorial en inglés

Microelectronics Reliability is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems. The coverage of the journal includes the following topics: physics and analysis; evaluation and prediction; modelling and simulation; methodologies and assurance. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, packaging and testing, will also be welcome, and practical papers reporting case studies in the field are particularly encouraged.

Palabras clave – provistas por la editorial

No disponibles.

Disponibilidad

Institución detectada	Período	Navegá	Descargá	Solicitá
No detectada	desde ene. 1962 / hasta dic. 1994	ScienceDirect

Información

Tipo de recurso:

revistas

ISSN impreso

0026-2714

ISSN electrónico

1872-941X

Editor responsable

Elsevier

País de edición

Reino Unido

Fecha de publicación

1964-

Cobertura temática

Ingeniería eléctrica, electrónica e informática

Tabla de contenidos

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doi: 10.1016/j.microrel.2020.113591

The rate of Cu doped TiO2 interlayer effects on the electrical characteristics of Al/Cu:TiO2/n-Si (MOS) capacitors depend on frequency and voltage

M.O. Erdal; A. Kocyigit; M. Yıldırım

Palabras clave: Electrical and Electronic Engineering; Atomic and Molecular Physics, and Optics; Electronic, Optical and Magnetic Materials; Surfaces, Coatings and Films; Safety, Risk, Reliability and Quality; Condensed Matter Physics.

Pp. 113591