Catálogo de publicaciones - revistas
Metrologia
Resumen/Descripción – provisto por la editorial en inglés
Published 6 times per year, Metrologia covers the fundamentals of measurements, particularly those dealing with the seven base units of the International System of Units (metre, kilogram, second, ampere, kelvin, candela, mole) or proposals to replace them.The journal also publishes papers that contribute to the solution of difficult measurement problems and improve the accuracy of derived units and constants that are of fundamental importance to physics.
In addition to regular papers, the journal publishes review articles, issues devoted to single topics of timely interest and occasional conference proceedings. Letters to the Editor and Short Communications (generally three pages or less) are also considered.
Palabras clave – provistas por la editorial
No disponibles.
Disponibilidad
Institución detectada | Período | Navegá | Descargá | Solicitá |
---|---|---|---|---|
No detectada | desde ene. 1965 / hasta dic. 2023 | IOPScience |
Información
Tipo de recurso:
revistas
ISSN impreso
0026-1394
ISSN electrónico
1681-7575
Editor responsable
Institute of Physics (IOP)
País de edición
Reino Unido
Fecha de publicación
1965-
Cobertura temática
Tabla de contenidos
Meta-study of laser power calibrations ranging 20 orders of magnitude with traceability to the kilogram
Paul A Williams; Matthew T Spidell; Joshua A Hadler; Thomas Gerrits; Amanda Koepke; David Livigni; Michelle S Stephens; Nathan A Tomlin; Gordon A Shaw; Jolene D Splett; Igor Vayshenker; Malcolm G White; Christopher S Yung; John H Lehman
Palabras clave: General Engineering.
Pp. 015001
Realization of the triple point of carbon dioxide evaluated by the ITS–90
Yasuki Kawamura; Nobuhiro Matsumoto; Tohru Nakano
Palabras clave: General Engineering.
Pp. 015004
On the transferability of the GUM-S1 type A uncertainty
Gerd Wübbeler; Clemens Elster
Palabras clave: General Engineering.
Pp. 015005
Thermodynamic temperature of the triple point of xenon measured by refractive index gas thermometry
P M C Rourke
Palabras clave: General Engineering.
Pp. 024001
Calibration of a W/Re thermocouple using Pd-C, Pt-C and Ru-C eutectic cells at NIM
T Zhang; X Lu; J Sun; J Pan
Palabras clave: General Engineering.
Pp. 024003
Traceable thickness measurement of ultra-thin HfO2 films by medium-energy ion scattering spectroscopy
Kyung Joong Kim; Tae Gun Kim; Ji-Hwan Kwon; Hyun Ruh; Kyungsu Park; Won Ja Min
Palabras clave: General Engineering.
Pp. 025001
Linking mass measured by the quartz crystal microbalance to the SI
C Stambaugh; H Shakeel; M Litorja; J M Pomeroy
Palabras clave: General Engineering.
Pp. 025002
Sphere diameter interferometry with nanometer uncertainty
Eric Stanfield; John Stoup; Michael Braine; Ted Doiron
Palabras clave: General Engineering.
Pp. 025003
Accurate second dielectric virial coefficient of helium, neon, and argon from ab initio potentials and polarizabilities
Bo Song; Qing-Yao Luo
Palabras clave: General Engineering.
Pp. 025007