Catálogo de publicaciones - libros
Applied Scanning Probe Methods III: Characterization
Bharat Bhushan ; Harald Fuchs (eds.)
Resumen/Descripción – provisto por la editorial
No disponible.
Palabras clave – provistas por la editorial
No disponibles.
Disponibilidad
Institución detectada | Año de publicación | Navegá | Descargá | Solicitá |
---|---|---|---|---|
No detectada | 2006 | SpringerLink |
Información
Tipo de recurso:
libros
ISBN impreso
978-3-540-26909-0
ISBN electrónico
978-3-540-26910-6
Editor responsable
Springer Nature
País de edición
Reino Unido
Fecha de publicación
2006
Información sobre derechos de publicación
© Springer-Verlag Berlin Heidelberg 2006
Cobertura temática
Tabla de contenidos
Scanning Probe Methods in the Magnetic Tape Industry
James K. Knudsen
The most striking and impressive feature of AFM is probably related to its flexibility, with particular emphasis on detailed morphological, contact mechanics, friction and adhesion studies routinely performed under different environments. These capabilities have led the AFM to extend our fundamental knowledge on friction phenomena.
Considerable progress has been made on friction laws and it appears well-established that the phenomenological Amontons—Dejaguin equation can safely be extended down to the nanoscale, describing both single-asperity and multi-asperity contacts. Therefore, a new challenging subject regards the characterization of the shear stress τ and its dependence on the physically relevant dissipation channels and sliding parameters. On the theoretical side, models have been developed treating the role of multiscale surface roughness, thus it is now possible to predict some of the most significant properties of solid bodies in contact.
Pp. 343-369