Catálogo de publicaciones - revistas

Compartir en
redes sociales


Metrologia

Resumen/Descripción – provisto por la editorial en inglés
Published 6 times per year, Metrologia covers the fundamentals of measurements, particularly those dealing with the seven base units of the International System of Units (metre, kilogram, second, ampere, kelvin, candela, mole) or proposals to replace them.

The journal also publishes papers that contribute to the solution of difficult measurement problems and improve the accuracy of derived units and constants that are of fundamental importance to physics.

In addition to regular papers, the journal publishes review articles, issues devoted to single topics of timely interest and occasional conference proceedings. Letters to the Editor and Short Communications (generally three pages or less) are also considered.
Palabras clave – provistas por la editorial

No disponibles.

Disponibilidad
Institución detectada Período Navegá Descargá Solicitá
No detectada desde ene. 1965 / hasta dic. 2023 IOPScience

Información

Tipo de recurso:

revistas

ISSN impreso

0026-1394

ISSN electrónico

1681-7575

Editor responsable

Institute of Physics (IOP)

País de edición

Reino Unido

Fecha de publicación

Cobertura temática

Tabla de contenidos

Meta-study of laser power calibrations ranging 20 orders of magnitude with traceability to the kilogram

Paul A WilliamsORCID; Matthew T Spidell; Joshua A Hadler; Thomas Gerrits; Amanda Koepke; David Livigni; Michelle S Stephens; Nathan A Tomlin; Gordon A ShawORCID; Jolene D Splett; Igor Vayshenker; Malcolm G White; Christopher S Yung; John H Lehman

Palabras clave: General Engineering.

Pp. 015001

Realization of the triple point of carbon dioxide evaluated by the ITS–90

Yasuki KawamuraORCID; Nobuhiro MatsumotoORCID; Tohru NakanoORCID

Palabras clave: General Engineering.

Pp. 015004

On the transferability of the GUM-S1 type A uncertainty

Gerd Wübbeler; Clemens Elster

Palabras clave: General Engineering.

Pp. 015005

Thermodynamic temperature of the triple point of xenon measured by refractive index gas thermometry

P M C RourkeORCID

Palabras clave: General Engineering.

Pp. 024001

Calibration of a W/Re thermocouple using Pd-C, Pt-C and Ru-C eutectic cells at NIM

T Zhang; X LuORCID; J SunORCID; J PanORCID

Palabras clave: General Engineering.

Pp. 024003

Traceable thickness measurement of ultra-thin HfO2 films by medium-energy ion scattering spectroscopy

Kyung Joong KimORCID; Tae Gun KimORCID; Ji-Hwan Kwon; Hyun Ruh; Kyungsu Park; Won Ja Min

Palabras clave: General Engineering.

Pp. 025001

Linking mass measured by the quartz crystal microbalance to the SI

C StambaughORCID; H ShakeelORCID; M LitorjaORCID; J M PomeroyORCID

Palabras clave: General Engineering.

Pp. 025002

Sphere diameter interferometry with nanometer uncertainty

Eric Stanfield; John Stoup; Michael Braine; Ted Doiron

Palabras clave: General Engineering.

Pp. 025003

Accurate second dielectric virial coefficient of helium, neon, and argon from ab initio potentials and polarizabilities

Bo SongORCID; Qing-Yao Luo

Palabras clave: General Engineering.

Pp. 025007

Uncertainty evaluation of the PTB stationary reference facilities for road vehicle speed

R WynandsORCID; J Kupper; A Borchers; W Siemann; T Beckmann; F Märtens

Palabras clave: General Engineering.

Pp. 025012