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Applied Scanning Probe Methods III: Characterization

Bharat Bhushan ; Harald Fuchs (eds.)

Resumen/Descripción – provisto por la editorial

No disponible.

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Institución detectada Año de publicación Navegá Descargá Solicitá
No detectada 2006 SpringerLink

Información

Tipo de recurso:

libros

ISBN impreso

978-3-540-26909-0

ISBN electrónico

978-3-540-26910-6

Editor responsable

Springer Nature

País de edición

Reino Unido

Fecha de publicación

Información sobre derechos de publicación

© Springer-Verlag Berlin Heidelberg 2006

Cobertura temática

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Scanning Probe Methods in the Magnetic Tape Industry

James K. Knudsen

The most striking and impressive feature of AFM is probably related to its flexibility, with particular emphasis on detailed morphological, contact mechanics, friction and adhesion studies routinely performed under different environments. These capabilities have led the AFM to extend our fundamental knowledge on friction phenomena.

Considerable progress has been made on friction laws and it appears well-established that the phenomenological Amontons—Dejaguin equation can safely be extended down to the nanoscale, describing both single-asperity and multi-asperity contacts. Therefore, a new challenging subject regards the characterization of the shear stress τ and its dependence on the physically relevant dissipation channels and sliding parameters. On the theoretical side, models have been developed treating the role of multiscale surface roughness, thus it is now possible to predict some of the most significant properties of solid bodies in contact.

Pp. 343-369